Polishing and surface finishing data (AFM, profilometry, interferometry)
Publicado em
02/06/2024 09h01
Atualizado em
02/06/2025 09h02
Description: Topography and roughness measurements of polished and coated LiNbO₃ materials using Atomic Force Microscopy (AFM) and optical profilometry.
File format: .spm (Bruker AFM), .opd (Veeco WYKO NT1100)
Parameters:
Sample_materials: LiNbO₃ (single fiber), LiNbO₃:Fe (single fiber, wafer), ITO-coated LiNbO₃:Fe, Ag-coated LiNbO₃:Fe
Surface_preparation: As-grown (single fiber), polished (single fiber), optically polished (wafer)
Roughness_parameters: Ra, Rq, Rz, Rmax
Licence: CC BY-NC-SA
Keywords: Lithium niobate, Surface roughness
Contact for data requests: franciele.carlesso@inpe.br